Surface Analysis The Principal Techniques 2nd Edition by John Vickerman, Ian Gilmore ISBN 0470017643 978-0470017647
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Product details:
ISBN 10: 0470017643
ISBN 13: 978-0470017647
Author: John C. Vickerman, Ian S. Gilmore
This completely updated and revised second edition of Surface Analysis: The Principal Techniques, deals with the characterisation and understanding of the outer layers of substrates, how they react, look and function which are all of interest to surface scientists. Within this comprehensive text, experts in each analysis area introduce the theory and practice of the principal techniques that have shown themselves to be effective in both basic research and in applied surface analysis.
Examples of analysis are provided to facilitate the understanding of this topic and to show readers how they can overcome problems within this area of study.
Table of contents:
-
Introduction
1.1 How do we Define the Surface?
1.2 How Many Atoms in a Surface?
1.3 Information Required
1.4 Surface Sensitivity
1.5 Radiation Effects – Surface Damage
1.6 Complexity of the Data -
Auger Electron Spectroscopy
2.1 Introduction
2.2 Principle of the Auger Process
2.2.1 Kinetic Energies of Auger Peaks
2.2.2 Ionization Cross-Section
2.2.3 Comparison of Auger and Photon Emission
2.2.4 Electron Backscattering
2.2.5 Escape Depth
2.2.6 Chemical Shifts
2.3 Instrumentation
2.3.1 Electron Sources
2.3.2 Spectrometers
2.3.3 Modes of Acquisition
2.3.4 Detection Limits
2.3.5 Instrument Calibration
2.4 Quantitative Analysis
2.5 Depth Profile Analysis
2.5.1 Thin Film Calibration Standard
2.5.2 Depth Resolution
2.5.3 Sputter Rates
2.5.4 Preferential Sputtering
2.5.5 λ-Correction
2.5.6 Chemical Shifts in AES Profiles
2.6 Summary -
Electron Spectroscopy for Chemical Analysis
3.1 Overview
3.1.1 The Basic ESCA Experiment
3.1.2 A History of the Photoelectric Effect and ESCA
3.1.3 Information Provided by ESCA
3.2 X-ray Interaction with Matter, the Photoelectron Effect and Photoemission from Solids
3.3 Binding Energy and the Chemical Shift
3.3.1 Koopmans’ Theorem
3.3.2 Initial State Effects
3.3.3 Final State Effects
3.3.4 Binding Energy Referencing
3.3.5 Charge Compensation in Insulators
3.3.6 Peak Widths
3.3.7 Peak Fitting
3.4 Inelastic Mean Free Path and Sampling Depth
3.5 Quantification
3.5.1 Quantification Methods
3.5.2 Quantification Standards
3.5.3 Quantification Example
3.6 Spectral Features
3.7 Instrumentation
3.7.1 Vacuum Systems for ESCA Experiments
3.7.2 X-ray Sources
3.7.3 Analyzers
3.7.4 Data Systems
3.7.5 Accessories
3.8 Spectral Quality
3.9 Depth Profiling
3.10 X–Y Mapping and Imaging
3.11 Chemical Derivatization
3.12 Valence Band
3.13 Perspectives
3.14 Conclusions -
Molecular Surface Mass Spectrometry by SIMS
4.1 Introduction
4.2 Basic Concepts
4.2.1 The Basic Equation
4.2.2 Sputtering
4.2.3 Ionization
4.2.4 The Static Limit and Depth Profiling
4.2.5 Surface Charging
4.3 Experimental Requirements
4.3.1 Primary Beam
4.3.2 Mass Analysers
4.4 Secondary Ion Formation
4.4.1 Introduction
4.4.2 Models of Sputtering
4.4.3 Ionization
4.4.4 Influence of the Matrix Effect in Organic Materials Analysis
4.5 Modes of Analysis
4.5.1 Spectral Analysis
4.5.2 SIMS Imaging or Scanning SIMS
4.5.3 Depth Profiling and 3D Imaging
4.6 Ionization of the Sputtered Neutrals
4.6.1 Photon Induced Post-Ionization
4.6.2 Photon Post-Ionization and SIMS
4.7 Ambient Methods of Desorption Mass Spectrometry -
Dynamic SIMS
5.1 Fundamentals and Attributes
5.1.1 Introduction
5.1.2 Variations on a Theme
5.1.3 The Interaction of the Primary Beam with the Sample
5.1.4 Depth Profiling
5.1.5 Complimentary Techniques and Data Comparison
5.2 Areas and Methods of Application
5.2.1 Dopant and Impurity Profiling
5.2.2 Profiling High Concentration Species
5.2.3 Use of SIMS in Near Surface Regions
5.2.4 Applications of SIMS Depth Profiling in Materials Science
5.3 Quantification of Data
5.3.1 Quantification of Depth Profiles
5.3.2 Fabrication of Standards
5.3.3 Depth Measurement and Calibration of the Depth Scale
5.3.4 Sources of Error in Depth Profiles
5.4 Novel Approaches
5.4.1 Bevelling and Imaging or Line Scanning
5.4.2 Reverse-Side Depth Profiling
5.4.3 Two-Dimensional Analysis
5.5 Instrumentation
5.5.1 Overview
5.5.2 Secondary Ion Optics
5.5.3 Dual Beam Methods and ToF
5.5.4 Gating
5.6 Conclusions -
Low-Energy Ion Scattering and Rutherford Backscattering
6.1 Introduction
6.2 Physical Basis
6.2.1 The Scattering Process
6.2.2 Collision Kinematics
6.2.3 Interaction Potentials and Cross-sections
6.2.4 Shadow Cone
6.2.5 Computer Simulation
6.3 Rutherford Backscattering
6.3.1 Energy Loss
6.3.2 Apparatus
6.3.3 Beam Effects
6.3.4 Quantitative Layer Analysis
6.3.5 Structure Analysis
6.3.6 Medium-Energy Ion Scattering (MEIS)
6.3.7 The Value of RBS and Comparison to Related Techniques
6.4 Low-Energy Ion Scattering
6.4.1 Neutralization
6.4.2 Apparatus
6.4.3 Surface Composition Analysis
6.4.4 Structure Analysis
6.4.5 Conclusions -
Vibrational Spectroscopy from Surfaces
7.1 Introduction
7.2 Infrared Spectroscopy from Surfaces
7.2.1 Transmission IR Spectroscopy
7.2.2 Photoacoustic Spectroscopy
7.2.3 Reflectance Methods
7.3 Electron Energy Loss Spectroscopy (EELS)
7.3.1 Inelastic or ‘Impact’ Scattering
7.3.2 Elastic or ‘Dipole’ Scattering
7.3.3 The EELS (HREELS) Experiment
7.4 The Group Theory of Surface Vibrations
7.4.1 General Approach
7.4.2 Group Theory Analysis of Ethyne Adsorbed at a Flat, Featureless Surface
7.4.3 Group Theory Analysis of Ethyne Adsorbed at a (100) Surface of an FCC Metal
7.4.4 The Expected Form of the RAIRS and Dipolar EELS (HREELS) Spectra
7.5 Laser Raman Spectroscopy from Surfaces
7.5.1 Theory of Raman Scattering
7.5.2 The Study of Collective Surface Vibrations (Phonons) using Raman Spectroscopy
7.5.3 Raman Spectroscopy from Metal Surfaces
7.5.4 Spatial Resolution in Surface Raman Spectroscopy
7.5.5 Fourier Transform Surface Raman Techniques
7.6 Inelastic Neutron Scattering (INS)
7.6.1 Introduction to INS
7.6.2 The INS Spectrum
7.6.3 INS Spectra of Hydrodesulfurization Catalysts
7.7 Sum-Frequency Generation Methods -
Surface Structure Determination by Interference Techniques
8.1 Introduction
8.1.1 Basic Theory of Diffraction – Three Dimensions
8.1.2 Extension to Surfaces – Two Dimensions
8.2 Electron Diffraction Techniques
8.2.1 General Introduction
8.2.2 Low Energy Electron Diffraction
8.2.3 Reflection High Energy Electron Diffraction (RHEED)
8.3 X-ray Techniques
8.3.1 General Introduction
8.3.2 X-ray Adsorption Spectroscopy
8.3.3 Surface X-ray Diffraction (SXRD)
8.3.4 X-ray Standing Waves (XSWs)
8.4 Photoelectron Diffraction
8.4.1 Introduction
8.4.2 Theoretical Considerations
8.4.3 Experimental Details
8.4.4 Applications of XPD and PhD -
Scanning Probe Microscopy
9.1 Introduction
9.2 Scanning Tunnelling Microscopy
9.2.1 Basic Principles of the STM
9.2.2 Instrumentation and Basic Operation Parameters
9.2.3 Atomic Resolution and Spectroscopy: Surface Crystal and Electronic Structure
9.3 Atomic Force Microscopy
9.3.1 Basic Principles of the AFM
9.3.2 Chemical Force Microscopy
9.3.3 Friction Force Microscopy
9.3.4 Biological Applications of the AFM
9.4 Scanning Near-Field Optical Microscopy
9.4.1 Optical Fibre Near-Field Microscopy
9.4.2 Apertureless SNOM
9.5 Other Scanning Probe Microscopy Techniques
9.6 Lithography Using Probe Microscopy Methods
9.6.1 STM Lithography
9.6.2 AFM Lithography
9.6.3 Near-Field Photolithography
9.6.4 The ‘Millipede’ -
The Application of Multivariate Data Analysis Techniques in Surface Analysis
10.1 Introduction
10.2 Basic Concepts
10.2.1 Matrix and Vector Representation of Data
10.2.2 Dimensionality and Rank
10.2.3 Relation to Multivariate Analysis
10.2.4 Choosing the Appropriate Multivariate Method
10.3 Factor Analysis for Identification
10.3.1 Terminology
10.3.2 Mathematical Background
10.3.3 Principal Component Analysis
10.3.4 Multivariate Curve Resolution
10.3.5 Analysis of Multivariate Images
10.4 Regression Methods for Quantification
10.4.1 Terminology
10.4.2 Mathematical Background
10.4.3 Principal Component Regression
10.4.4 Partial Least Squares Regression
10.4.5 Calibration, Validation and Prediction
10.4.6 Example – Correlating ToF–SIMS Spectra with Polymer Wettability Using PLS
10.5 Methods for Classification
10.5.1 Discriminant Function Analysis
10.5.2 Hierarchal Cluster Analysis
10.5.3 Artificial Neural Networks
10.6 Summary and Conclusion
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Tags: John Vickerman, Ian Gilmore, Surface Analysis, The Principal Techniques