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Structural Characterisation of Graphene Flakes Part 3 Determination of level of Defects on Graphene Flakes by Raman Spectroscopy 2019th Edition by Enterprise Singapore ISBN 9789814835664 9814835668

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Structural Characterisation of Graphene Flakes Part 3 Determination of level of Defects on Graphene Flakes by Raman Spectroscopy 2019th Edition Enterprise Singapore Digital Instant Download

Author(s): Enterprise Singapore
ISBN(s): 9789814835664, 9814835668
Edition: 2019
File Details: PDF, 5.63 MB
Year: 2019
Language: english
SKU: EB-36427338 Category: Tag:

Structural Characterisation of Graphene Flakes Part 3 Determination of level of Defects on Graphene Flakes by Raman Spectroscopy – Ebook PDF Instant Download/Delivery:  9789814835664, 9814835668 
Full download Structural Characterisation of Graphene Flakes Part 3 Determination of level of Defects on Graphene Flakes by Raman Spectroscopy 2019th Edition by Enterprise Singapore after payment

Product details: 

ISBN 10:  9814835668 

ISBN 13:  9789814835664

Author: Enterprise Singapore

The Structural Characterisation of Graphene Flakes involves analyzing their morphology, layer number, defect density, and crystallinity using various techniques. Key methods include:

Atomic Force Microscopy (AFM): Measures thickness and surface roughness.

Raman Spectroscopy: Identifies layer number, defects (D-band), and crystallinity (G-band, 2D-band).

Transmission Electron Microscopy (TEM): Provides high-resolution imaging to assess flake structure and defects.

X-ray Photoelectron Spectroscopy (XPS): Analyzes chemical composition and functional groups.

X-ray Diffraction (XRD): Determines interlayer spacing and crystalline structure.

These techniques together provide a comprehensive understanding of graphene flakes, crucial for their applications in electronics, sensors, and nanocomposites.

Table of contents: 

  1. Introduction

  2. Scope

  3. Normative References

  4. Terms and Definitions

  5. Principles

  6. Equipment

  7. Procedure

  8. Uncertainty

  9. Test Report

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Tags: Enterprise Singapore, Structural Characterisation, Graphene Flakes