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Scanning Probe Microscopy of Functional Materials 2011th Edition by Sergei Kalinin, Alexei Gruverman ISBN 144196567X 978-1441965677

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Scanning Probe Microscopy of Functional Materials 2011th Edition Sergei V. Kalinin Digital Instant Download

Author(s): Sergei V. Kalinin, Alexei Gruverman
ISBN(s): 9781441965677, 144196567X
Edition: 2011
File Details: PDF, 32.31 MB
Year: 2010
Language: english
SKU: EB-1942206 Category: Tags: ,

Scanning Probe Microscopy of Functional Materials 2011th Edition by Sergei V. Kalinin,  Alexei Gruverman- Ebook PDF Instant Download/Delivery: 144196567X, 978-1441965677
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Product details: 

ISBN 10: 144196567X 

ISBN 13: 978-1441965677

Author: Sergei V. Kalinin,  Alexei Gruverman

The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Examples include electrical transport and magnetic, optical, and electromechanical properties. By bringing together critical reviews by leading researchers on the application of SPM to to the nanoscale characterization of functional materials properties, this book provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology.

Table of contents: 

Part I Spectroscopic SPM at the Resolution Limits

1 Excitation and Mechanisms of Single Molecule Reactions in Scanning Tunneling Microscopy

Peter Maksymovych

2 High-Resolution Architecture and Structural Dynamics of Microbial and Cellular Systems: Insights from in Vitro Atomic Force Microscopy…

Alexander J. Malkin and Marco Plomp

Part II Dynamic Spectroscopic SPM

3 Dynamic Force Microscopy and Spectroscopy in Ambient Conditions: Theory and Applications

Hendrik Hölscher, Jan-Erik Schmutz, and Udo D. Schwarz

4 Measuring Mechanical Properties on the Nanoscale with Contact Resonance Force Microscopy Methods.

D.C. Hurley

5 Multi-Frequency Atomic Force Microscopy

Roger Prock

6 Dynamic Nanomechanical Characterization

Using Multiple-Frequency Method

Ozgar Sahin

Part III Thermal Characterization by SPM

7 Toward Nanoscale Chemical Imaging: The Intersection of Scanning Probe Microscopy and Mass Spectrometry

Olga S. Ovchinnikova

8 Dynamic SPM Methods for Local Analysis of Thermo-Mechanical Properties…

M.P. Nikiforov and R. Proksch

Part IV Electrical and Electromechanical SPM

9 Advancing Characterization of Materials with Atomic Force Microscopy-Based Electric Techniques.

Sergei Magonov, John Alexander, and Shijie Wu

10 Quantitative Piezoresponse Force Microscopy: Calibrated Experiments, Analytical Theory and Finite Element Modeling

Lili Tian, ​​Vasudeva Rao Aravind, and Venkatraman Gopalan

11 High-Speed Piezo Force Microscopy: Novel Observations of Ferroelectric Domain Poling, Nucleation, and Growth Bryan D. Huey and Ramesh Nath

12 Polar Structures in Relaxors by Piezoresponse Force Microscopy

V.V. Shvartsman, W. Kleemann, D.A. Kiselev, I.K. Bdikin, and A.L. Kholkin

13 Symmetries in Piezoresponse Force Microscopy. Andreas Ruediger

Part V Novel SPM Concepts

14 New Capabilities at the Interface of X-Rays and Scanning Tunneling Microscopy

Volker Rose, John W. Freeland, and Stephen K. Streiffer

15 Scanning Ion Conductance Microscopy Johannes Rheinlaender and Tilman E. Schäffer

16 Combined Voltage-Clamp and Atomic Force Microscope for the Study of Membrane Electromechanics. Arthur Beyder and Frederick Sachs

17 Dynamic and Spectroscopic Modes and Multivariate Data Analysis in Piezoresponse Force Microscopy

B.J. Rodriguez, S.Jesse, K. Seal, N. Balke, S.V. Kalinin, and R. Proksch

18 Polarization Behavior in Thin Film Ferroelectric

Capacitors at the Nanoscale

A. Gruverman

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Tags: Sergei Kalinin, Alexei Gruverman, Scanning Probe Microscopy