Measurement Technology and Intelligent Instruments IX 1st edition by Yuri Chugui, Yongsheng Gao, Kuang-Chao Fan, Roald Taymanov, Ksenia Sapozhnikova – Ebook PDF Instant Download/Delivery: 0878492739, 978-0878492732
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Product details:
ISBN 10: 0878492739
ISBN 13: 978-0878492732
Author: Yuri Chugui, Yongsheng Gao, Kuang-Chao Fan, Roald Taymanov, Ksenia Sapozhnikova
Measurement Technology and Intelligent Instruments IX 1st Table of contents:
I. General Problems of Measurement
- Principles of Bayesian Methods in Data Analysis
- Dynamic Pressure Calibration of Pressure Sensors Using Liquid Step Pressure Generator
- Topical Tasks of Metrology Due to Measuring Instruments Computerization
- Multivariant System of Perspectives
II. Micro- / Nanomeasurements and Metrology
- Coherent Optical Method for Studies of Nanoscale Objects in Liquid Media Based Upon Spatial Averaging of Data
- Measurement and Visualization of Dynamics of Piezoelectric Microcantilever
- Microrelief Measurements for White-Light Interferometer with Adaptive Algorithm Interferogram Processing
- Model-Based Correction of Image Distortion in Scanning Electron Microscopy
- Motif Parameters Based Characterization of Line Edge Roughness of a Nanoscale Grating Structure
- Nanorelief Measurement Errors for a White-Light Interferometer with Chromatic Aberrations
- Fabrication of Large Grating by Monitoring the Latent Fringe Pattern
- Design and Analysis of a 6-DOF Monolithic Nanopositioning Stage
- In Situ Mechanical Property Measurement of Titania Nanowires
III. Optical and X-Ray Tomography and Interferometry
- Computed Tomography for Application in Manufacturing Metrology
- Achieving Traceability of Industrial Computed Tomography
- Developments in Homodyne Interferometry
- Development of Innovative Fringe Locking Strategies for Vibration-Resistant White Light Vertical Scanning Interferometry (VSI)
- Compensation of Tilt Angles and Verification of Displacement Measurements with a Fabry-Perot Interferometer
- A Compact Signal Processing with Position Sensitive Detectors Utilized for Michelson Interferometer
- Improvement on Measuring Optical Nonlinear Phase Shift by Self-Aligned Interferometer
- Programmable Holographic Optical Elements as Adaptive Optics in Optical Diagnostics Devices
- High-Resolution Dimensional Metrology for Industrial Applications
IV. Measurements for Geometrical and Mechanical Quantities
- Traceability for Areal Surface Texture Measurement
- Industrial Applications of Image-Based Measurement Techniques in Aerodynamics – Problems, Progress, and Future Needs
- Development of a Print-Through Phenomenon Measurement System Using the Fringe Reflection Method for the Fiber Reinforced Plastics
- Micro Coordinate Measuring Machine for Parallel Measurement of Microstructures
- Machine Vision for Surface Roughness Assessment of Inclined Components
- Fractal Geometry Surface Modeling and Measurement for Musical Cymbal Surface Texture Design and Rapid Manufacturing
- Final Results of the Geometrical Calibration of the Pressure Balances to be Used for the New Determination of the Boltzmann Constant
- 3D Inspection of Fuel Assembly Components
- High Precision Angular and Linear Measurements Using Universal Opto-Electronic Measuring Modules in Distributed Measuring Systems
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