(Ebook PDF) Advances in Imaging and Electron Physics 130 1st Edition by Peter Hawkes-Ebook PDF Instant Download/Delivery:9780080493268, 0080493262
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ISBN 10:0080493262
ISBN 13:9780080493268
Author: Peter W. Hawkes
The subjects reviewed in the ‘Advances’ series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volume concentrates on microscopy and pattern recognition and also electron physics.
Several of these topics are covered in this volume, which opens with a long
chapter of monograph stature on quantitative electron microscopy at the
atomic resolution level by scientists from a well-known and very
distinguished Antwerp University Laboratory. This is unique in that the
statistical aspects are explored fully. This is followed by a contribution
by A.M. Grigoryan and S.S. Again on transform-based image enhancement,
covering both frequency-ordered systems and tensor approaches. The volume
concludes with an account of the problems of image registration and ways of
solving them by Maria Petrou of the University of Surrey; feature detection,
related image transforms and quality measures are examined separately.
The text bridges the gap between academic researchers and R&D designers by addressing and solving daily issues, which makes this book essential reading.
Table of Contents:
- Chapter 1. Statistical Experimental Design for Quantitative Atomic Resolution Transmission Electron
- I. Introduction
- II. Basic Principles of Statistical Experimental Design
- III. Statistical Experimental Design of Atomic Resolution Transmission Electron Microscopy Using Sim
- IV. Optimal Statistical Experimental Design of Conventional Transmission Electron Microscopy
- V. Optimal Statistical Experimental Design of Scanning Transmission Electron Microscopy
- VI. Discussion and Conclusions
- References
- Chapter 2. Transform-Based Image Enhancement Algorithms with Performance Measure
- I. Introduction
- II. Transforms with Frequency Ordered Systems
- III. Tensor Method of Image Enhancement
- References
- Chapter 3. Image Registration: An Overview
- I. Introduction
- II. Similarity Measures
- III. Deriving the Transformation Between the Two Images
- IV. Feature Extraction
- V. Literature Survey
- VI. Conclusions
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Advancesm,Imaging,Electron Physics,Peter Hawkes