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SS 643 1 2019 Structural characterisation of graphene flakes Part 1 Methods and sample preparation 2019th Edition by Singapore Standard ISBN 9789814835640 9814835641

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SS 643 1 2019 Structural characterisation of graphene flakes Part 1 Methods and sample preparation 2019th Edition Singapore Standard Digital Instant Download

Author(s): Singapore Standard
ISBN(s): 9789814835640, 9814835641
Edition: 2019
File Details: PDF, 8.80 MB
Year: 2019
Language: english
SKU: EB-36427196 Category: Tag:

SS 643 1 2019 Structural characterisation of graphene flakes Part 1 Methods and sample preparation 2019th Edition by Singapore Standard  – Ebook PDF Instant Download/Delivery:  9789814835640, 9814835641
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Product details: 

ISBN 10:  9814835641

ISBN 13: 9789814835640

Author: Singapore Standard 

SS 643-1:2019 – Structural Characterisation of Graphene Flakes – Part 1: Methods and Sample Preparation

This standard provides guidance on methods and procedures for sample preparation to support structural characterisation of graphene flakes. It focuses on preparing samples from powders or suspensions to enable subsequent structural analysis.

SS 643-1:2019 is the first part of the SS 643 series on structural characterisation of graphene, which includes:

  • Part 1: Methods and sample preparation (SS 643-1:2019)

  • Part 2: Determination of lateral size of graphene flakes by optical microscopy

  • Part 3: Determination of defect levels on graphene flakes by Raman spectroscopy

  • Part 4: Determination of number of layers in graphene flakes by atomic force microscopy (AFM)

This set of standards is developed under the oversight of the Chemical Standards Committee of Singapore, aiming to support quality control and analysis of nanomaterials such as graphene in both research and industrial applications.

Table of contents: 

1 Introduction
2 Scope
3 Normative references
4 Terms and definitions
5 Principle
6 Apparatus
7 Procedure
8 Uncertainties
9 Test report

Figures
10 AFM image and flakes height measurement
11 AFM histogram of flake thickness of test samples
12 Cumulative distribution curve of number of layers in the measured flakes

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Tags: Singapore Standard, SS 643 1 2019, Structural characterisation